Timing generator and semiconductor testing apparatus

Details Timing generator and semiconductor testing apparatus Timing generator and semiconductor testing apparatus

2005-06-06

2010-02-16

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S738000, C714S703000, C714S707000, C714S739000, C714S745000, C714S814000, C327S265000, C327S279000, C327S286000, C327S170000, C327S107000, C375S371000, C375S226000, C702S069000, C370S516000

Reexamination Certificate

active

07665004

ABSTRACT:
A timing generator that needs no analog circuit for adding jitters and allows the circuit scale and power consumption to be reduced. There are included a counter for performing a counting operation synchronized with a reference clock signal: a timing memory for outputting respective data corresponding to the quotient and remainder resulting from dividing the time from the front of a basic period until a generation of a timing edge by the period of the reference clock signal: a coincidence detecting circuit for outputting a signal that exhibits a high level when the count value of the counter coincides with the quotient: a jitter generating circuit for outputting as a jitter amplitude value: adders for adding a time corresponding to the remainder and a time represented by the jitter amplitude value outputted from the jitter generating circuit: and a variable delay circuit for delaying the output signal from the coincidence detecting circuit by the time represented by the addition result of the adders and outputting the delayed output signal.

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patent: 2000-2757 (2000-01-01), None

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