Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-05-22
2007-05-22
Garbowski, Leigh M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C703S019000
Reexamination Certificate
active
11101572
ABSTRACT:
A timing analysis apparatus reads a net list including connection information and the like of circuit cells of an LSI, delay data for previously storing delay information of the circuit cells, stage count-derating factor dependency and components P, V and T of a derating factor; detects the number of stages of each signal path by a signal path cell counting section; determines a derating factor corresponding to the extent of averaging of random variation of each signal path in accordance with the number of stages of the signal path; and performs timing analysis on the basis of the determined derating factor. Therefore, more realistic and highly accurate timing design can be performed on a large-scale circuit.
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Garbowski Leigh M.
Matsushita Electric - Industrial Co., Ltd.
McDermott Will & Emery LLP
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