Timing analysis method and apparatus

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C703S019000

Reexamination Certificate

active

11101572

ABSTRACT:
A timing analysis apparatus reads a net list including connection information and the like of circuit cells of an LSI, delay data for previously storing delay information of the circuit cells, stage count-derating factor dependency and components P, V and T of a derating factor; detects the number of stages of each signal path by a signal path cell counting section; determines a derating factor corresponding to the extent of averaging of random variation of each signal path in accordance with the number of stages of the signal path; and performs timing analysis on the basis of the determined derating factor. Therefore, more realistic and highly accurate timing design can be performed on a large-scale circuit.

REFERENCES:
patent: 5274568 (1993-12-01), Blinne et al.
patent: 5845233 (1998-12-01), Fishburn
patent: 5896299 (1999-04-01), Ginetti et al.
patent: 6090152 (2000-07-01), Hayes et al.
patent: 6484297 (2002-11-01), Dixit et al.
patent: 6795802 (2004-09-01), Yonezawa et al.
patent: 6820048 (2004-11-01), Bhutani et al.
patent: 6869808 (2005-03-01), Yonezawa et al.
patent: 7010475 (2006-03-01), Ehrler
patent: 7020589 (2006-03-01), Datta Ray et al.
patent: 7092838 (2006-08-01), Srinivas et al.
patent: 2004/0122642 (2004-06-01), Scheffer
patent: 2004/0167756 (2004-08-01), Yonezawa
patent: 2004/0254776 (2004-12-01), Andou
patent: 2005/0050499 (2005-03-01), Matsumoto et al.
patent: 2005/0060676 (2005-03-01), Matsumura et al.
patent: 2005/0081171 (2005-04-01), Kawano et al.
patent: 09-311877 (1997-12-01), None
patent: 2000-040098 (2000-02-01), None
patent: 2001-306647 (2001-11-01), None
patent: 2002-222232 (2002-08-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Timing analysis method and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Timing analysis method and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Timing analysis method and apparatus will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3724957

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.