Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-07-15
2008-07-15
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07401308
ABSTRACT:
A timing analysis apparatus includes a data extracting unit that extracts objective circuit data concerning an objective circuit to become an objective of a timing analysis from layout data indicating circuits on a large-scale-integration chip; a time calculating unit that calculates a delay time of the objective circuit based on the objective circuit data; a parameter calculating unit that calculates a parameter indicating a size of an arrangement area of the objective circuit based on the objective circuit data; an information calculating unit that calculates variation information concerning a variation of the delay time; and a timing analyzing unit that performs the timing analysis of the objective circuit using the delay time and the variation information.
REFERENCES:
patent: 6654938 (2003-11-01), Kosugi
patent: 6687890 (2004-02-01), Sato
patent: 7181717 (2007-02-01), Singh et al.
patent: 2004/0054979 (2004-03-01), Bobba et al.
patent: 2004/0060022 (2004-03-01), Allen et al.
patent: 2006/0048085 (2006-03-01), Tyler et al.
patent: 2006/0059446 (2006-03-01), Chen et al.
patent: 2002-215710 (2002-08-01), None
patent: 2002-312410 (2002-10-01), None
Oba Hisayoshi
Ushiyama Kenichi
Chiang Jack
Dimyan Magid Y
Fujitsu Limited
Staas & Halsey , LLP
LandOfFree
Timing analysis apparatus, timing analysis method, and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Timing analysis apparatus, timing analysis method, and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Timing analysis apparatus, timing analysis method, and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2777374