Threshold voltage adjustment for long channel transistors

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S290000

Reexamination Certificate

active

07422948

ABSTRACT:
A threshold voltage adjusted long-channel transistor fabricated according to short-channel transistor processes is described. The threshold-adjusted transistor includes a substrate with spaced-apart source and drain regions formed in the substrate and a channel region defined between the source and drain regions. A layer of gate oxide is formed over at least a part of the channel region with a gate formed over the gate oxide. The gate further includes at least one implant aperture formed therein with the channel region of the substrate further including an implanted region within the channel between the source and drain regions. Methods for forming the threshold voltage adjusted transistor are also disclosed.

REFERENCES:
patent: 4784965 (1988-11-01), Woo et al.
patent: 4924280 (1990-05-01), Fukuda et al.
patent: 4975385 (1990-12-01), Beinglass et al.
patent: 5091324 (1992-02-01), Hsu et al.
patent: 5136349 (1992-08-01), Yilmaz et al.
patent: 5286981 (1994-02-01), Lilja et al.
patent: 5364807 (1994-11-01), Hwang
patent: 5432126 (1995-07-01), Oikawa
patent: 5510639 (1996-04-01), Okuda et al.
patent: 5610089 (1997-03-01), Iwai et al.
patent: 5631485 (1997-05-01), Wei et al.
patent: 5661059 (1997-08-01), Liu et al.
patent: 5858825 (1999-01-01), Alsmeier et al.
patent: 5978258 (1999-11-01), Manning
patent: 6078082 (2000-06-01), Bulucea
patent: 6081662 (2000-06-01), Murakami et al.
patent: 6096616 (2000-08-01), Nistler et al.
patent: 6107129 (2000-08-01), Gardner et al.
patent: 6150204 (2000-11-01), Ahmad et al.
patent: 6255174 (2001-07-01), Yu
patent: 6262460 (2001-07-01), Kalnitsky et al.
patent: 6287922 (2001-09-01), Yu et al.
patent: 6297082 (2001-10-01), Lin et al.
patent: 6326254 (2001-12-01), Ema et al.
patent: 6333523 (2001-12-01), Sakamoto et al.
patent: 6383856 (2002-05-01), Inumiya et al.
patent: 6417085 (2002-07-01), Batra et al.
patent: 6495885 (2002-12-01), Ahmad et al.
patent: 6503805 (2003-01-01), Wang et al.
patent: 6524901 (2003-02-01), Trivedi
patent: 6534351 (2003-03-01), Muller et al.
patent: 6552394 (2003-04-01), Ahmad et al.
patent: 6599804 (2003-07-01), Bulucea et al.
patent: 6649461 (2003-11-01), Lia et al.
patent: 6936517 (2005-08-01), Choi et al.
patent: 2003/0170957 (2003-09-01), Hu et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Threshold voltage adjustment for long channel transistors does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Threshold voltage adjustment for long channel transistors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Threshold voltage adjustment for long channel transistors will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3977643

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.