Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2011-06-28
2011-06-28
Pham, Long (Department: 2814)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S301000, C438S302000
Reexamination Certificate
active
07968411
ABSTRACT:
A threshold voltage adjusted long-channel transistor fabricated according to short-channel transistor processes is described. The threshold-adjusted transistor includes a substrate with spaced-apart source and drain regions formed in the substrate and a channel region defined between the source and drain regions. A layer of gate oxide is formed over at least a part of the channel region with a gate formed over the gate oxide. The gate further includes at least one implant aperture formed therein with the channel region of the substrate further including an implanted region within the channel between the source and drain regions. Methods for forming the threshold voltage adjusted transistor are also disclosed.
REFERENCES:
patent: 4784965 (1988-11-01), Woo et al.
patent: 4924280 (1990-05-01), Fukuda et al.
patent: 4975385 (1990-12-01), Beinglass et al.
patent: 5091324 (1992-02-01), Hsu et al.
patent: 5136349 (1992-08-01), Yilmaz et al.
patent: 5286981 (1994-02-01), Lilja et al.
patent: 5364807 (1994-11-01), Hwang
patent: 5432126 (1995-07-01), Oikawa
patent: 5510639 (1996-04-01), Okuda et al.
patent: 5610089 (1997-03-01), Iwai et al.
patent: 5631485 (1997-05-01), Wei et al.
patent: 5661059 (1997-08-01), Liu et al.
patent: 5858825 (1999-01-01), Alsmeier et al.
patent: 5978258 (1999-11-01), Manning
patent: 6078082 (2000-06-01), Bulucea
patent: 6081662 (2000-06-01), Murakami et al.
patent: 6096616 (2000-08-01), Nistler et al.
patent: 6107129 (2000-08-01), Gardner et al.
patent: 6150204 (2000-11-01), Ahmad et al.
patent: 6255174 (2001-07-01), Yu
patent: 6262460 (2001-07-01), Kalnitsky et al.
patent: 6287922 (2001-09-01), Yu et al.
patent: 6297082 (2001-10-01), Lin et al.
patent: 6326254 (2001-12-01), Ema et al.
patent: 6333523 (2001-12-01), Sakamoto et al.
patent: 6383856 (2002-05-01), Inumiya et al.
patent: 6417085 (2002-07-01), Batra et al.
patent: 6495885 (2002-12-01), Ahmad et al.
patent: 6503805 (2003-01-01), Wang et al.
patent: 6524901 (2003-02-01), Trivedi
patent: 6534351 (2003-03-01), Muller et al.
patent: 6552394 (2003-04-01), Ahmad et al.
patent: 6599804 (2003-07-01), Bulucea et al.
patent: 6649461 (2003-11-01), Lai et al.
patent: 6936517 (2005-08-01), Choi et al.
patent: 7422948 (2008-09-01), Williford
patent: 2003/0170957 (2003-09-01), Hu et al.
patent: 2005/0064710 (2005-03-01), Chidambarrao et al.
Micro)n Technology, Inc.
Pham Long
TraskBritt
LandOfFree
Threshold voltage adjustment for long-channel transistors does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Threshold voltage adjustment for long-channel transistors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Threshold voltage adjustment for long-channel transistors will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2667408