Semiconductor device manufacturing: process – Gettering of substrate – By implanting or irradiating
Reexamination Certificate
2011-05-03
2011-05-03
Ha, Nathan W (Department: 2814)
Semiconductor device manufacturing: process
Gettering of substrate
By implanting or irradiating
C257S347000
Reexamination Certificate
active
07935613
ABSTRACT:
A silicon-on-insulator wafer (10). The SOI wafer (10) comprises a top silicon layer (6), a silicon substrate (4), and an oxide insulator layer (2) disposed across the wafer (10) and between the silicon substrate (4) and the top silicon layer (6). The oxide insulator layer (2) has at least one of a contoured top surface (8a, 8b, 8c, 8d, 8e) and a contoured bottom surface (12e). Also provided are processes for manufacturing such a SOI wafer (10).
REFERENCES:
patent: 5929507 (1999-07-01), Gonzalez et al.
patent: 6031261 (2000-02-01), Kang
patent: 6309934 (2001-10-01), Peckerar et al.
patent: 6548369 (2003-04-01), van Bentum
patent: 6653209 (2003-11-01), Yamagata
patent: 7153753 (2006-12-01), Forbes
patent: 7368790 (2008-05-01), Forbes
patent: 2002/0081824 (2002-06-01), Dolan et al.
patent: 2003/0124815 (2003-07-01), Henley et al.
patent: 2005/0026429 (2005-02-01), Liaw
patent: 0461362 (1997-08-01), None
patent: 07-078994 (1995-03-01), None
patent: 07-263538 (1995-10-01), None
patent: 07-263575 (1995-10-01), None
patent: 11-040512 (1999-02-01), None
patent: 2002-026137 (2002-01-01), None
patent: 2001-0103602 (2001-11-01), None
patent: WO03/083934 (2003-10-01), None
patent: 2005/062364 (2005-07-01), None
Haver H B et al. “Three-Dimensional Silicon on Oxide Device Isolation” Motorola Technical Developments, Motorola Inc. Schaumburg, Illinois, US vol. 7, Oct. 1, 1987 pp. 20-21, XP000050047.
Mao B-Y et al. “The Effect of Post-Oxygen-Implant Annealing Temperature on the Channel Mobilities of CMOS Devices in Oxygen-Implanted Silicon-On-Insulator Structures” IEEE Electron Device Letters, IEEE Service Center, New York, NY US vol. EDL-8, No. 7 Jul. 7, 1987, pp. 306-308, XP000821840.
International Search Report dated May 5, 2005.
Ha Nathan W
International Business Machines - Corporation
Jaklitsch Lisa V.
Petrokaitis Joseph
LandOfFree
Three-dimensional silicon on oxide device isolation does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Three-dimensional silicon on oxide device isolation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Three-dimensional silicon on oxide device isolation will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2655950