Thin film transistor, method of manufacturing the thin film...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S402000, C257SE29299, C257SE21409

Reexamination Certificate

active

07635619

ABSTRACT:
A thin film transistor according to an embodiment of the present invention includes: a semiconductor layer formed on a substrate and having a first diffusion region, a channel region, and a second diffusion region; a gate electrode opposite to the semiconductor layer across a gate insulating film formed on the semiconductor layer; and a connecting conductive film formed on the semiconductor layer opposite to the gate insulating film and extending from the first diffusion region up to a predetermined position in the channel region to electrically connect between the first diffusion region and the channel region. The transistor further includes a laying conductive layer formed on the semiconductor layer opposite to the gate insulating film and electrically connected with the second diffusion region.

REFERENCES:
patent: 2005/0082539 (2005-04-01), Fujimoto et al.
patent: 60-157258 (1985-08-01), None
patent: 9-181317 (1997-07-01), None
patent: 2003-140570 (2003-05-01), None
patent: 2004-327664 (2004-11-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Thin film transistor, method of manufacturing the thin film... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Thin film transistor, method of manufacturing the thin film..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thin film transistor, method of manufacturing the thin film... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4144142

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.