Testing a processor using a random code generator

Details Testing a processor using a random code generator Testing a processor using a random code generator

2005-04-26

2005-04-26

Decady, Albert C (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C703S022000, C703S026000

Reexamination Certificate

active

06886125

ABSTRACT:
A method and an apparatus make available uncommitted register values during the random code generation process. When there is a need for a register to contain a specific (desirable) value, then the register value is committed to that value at that point. Uncommitted values can propagate through one or more previous instructions. All registers and memory begin a test program in the uncommitted state. When the random code generator is done generating the test program, if any uncommitted values remain, then the uncommitted values are committed to arbitrary values.

REFERENCES:
patent: 5729554 (1998-03-01), Weir et al.

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