Testing a multibank memory module

Details Testing a multibank memory module Testing a multibank memory module

2006-10-31

2008-10-14

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C365S201000

Reexamination Certificate

active

07437630

ABSTRACT:
A method and system for testing a memory module that has at least a first and second memory bank. The first and second memory banks have a plurality of integrated circuit (IC) devices for storing data and the IC devices have a plurality of control lines coupled thereto. A first portion of the plurality of control lines are allocated to the IC devices of the first bank of the module. A second portion of the plurality of control lines are allocated to the IC devices of the second bank of the module. The IC devices of the first and second banks of the module are tested substantially simultaneously using the first and second portions of the plurality of control lines.

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