Tester having event generation circuit for acquiring waveform by

Details Tester having event generation circuit for acquiring waveform by Tester having event generation circuit for acquiring waveform by

1997-11-24

2000-10-03

De Cady, Albert

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

714739, 714 32, G06F 11273

Patent

active

061287547

ABSTRACT:
In a tester for testing circuits, apparatus and methods for acquiring waveform data from a circuit under test. While a test program is being run by the tester, waveform acquisition strobe events are generated for application to a terminal of a circuit under test. A measurement circuit receives the waveform acquisition strobe events and applies each strobe event to the terminal of the circuit and generates result signals representing the result of applying the strobe events to the terminal. A capture memory receives and stores result signals generated by the measurement circuit.

REFERENCES:
patent: 4497056 (1985-01-01), Sugamori
patent: 4678345 (1987-07-01), Agoston
patent: 4723158 (1988-02-01), White
patent: 5212443 (1993-05-01), West et al.
patent: 5477139 (1995-12-01), West et al.
patent: 5583430 (1996-12-01), Dinteman
patent: 5673275 (1997-09-01), Garcia et al.
"Logic Waveform Utility", Trillium Test Systems Applications, Note, by Robert Huston dated Feb. 4, 1986, pp. 1-17.

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