Tester for testing semiconductor device

Details Tester for testing semiconductor device Tester for testing semiconductor device

2007-07-25

2010-06-15

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S718000, C714S719000, C714S724000, C714S744000, C714S736000, C714S723000, C714S726000, C714S005110, C714S025000, C714S042000, C714S721000, C714S732000, C714S735000, C714S743000, C714S745000, C702S117000, C702S108000, C324S1540PB, C365S201000

Reexamination Certificate

active

07739572

ABSTRACT:
A tester for testing a semiconductor device is disclosed. The tester for testing the semiconductor device employs a data selector for converting a logical test pattern data transmitted from a pattern generator into a physical test pattern data and an expected data based on the logical test pattern data, thereby generating various timings based on a time delay instead of using a plurality of clocks to improve a test efficiency and reduce a manufacturing cost.

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