Test vehicle data analysis

Details Test vehicle data analysis Test vehicle data analysis

2008-05-06

2008-05-06

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S724000, C714S733000, C714S025000, C714S030000, C257S048000, C702S108000, C702S118000, C438S014000

Reexamination Certificate

active

07370257

ABSTRACT:
A system and method for collecting and analyzing integrated circuit test vehicle test data by identifying various blocks of circuitry through at least two different intersecting test paths. In one embodiment, the process test circuits may be arranged in a matrix format and connected so that they may be tested along rows or columns. When a failure along a specific row and a specific column is identified, the process test circuit at the intersection may be identified as the failure point.

REFERENCES:
patent: 4801869 (1989-01-01), Sprogis
patent: 5199035 (1993-03-01), Lopez et al.
patent: 5299204 (1994-03-01), Daniel
patent: 5674651 (1997-10-01), Nishi
patent: 5764654 (1998-06-01), Ohba et al.
patent: 6092223 (2000-07-01), Ahn
patent: 6185706 (2001-02-01), Sugasawara
patent: 6436741 (2002-08-01), Sato et al.
patent: 6483176 (2002-11-01), Noguchi et al.
patent: 6707064 (2004-03-01), Jang et al.
patent: 6781151 (2004-08-01), Schultz et al.
patent: 6861864 (2005-03-01), Schultz
patent: 6885950 (2005-04-01), Mitsutake et al.
patent: 2004/0031008 (2004-02-01), Satoh et al.
patent: 2005/0138499 (2005-06-01), Pileggi et al.

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