Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-10-31
2006-10-31
Tu, Christine T. (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C338S307000
Reexamination Certificate
active
07131047
ABSTRACT:
A test system includes a device under test and a test circuit board. The device under test includes a plurality of contacts configured to provide output signals. The test circuit board may convey the output signals from the device under test to an analyzer. The test circuit board may include a dielectric layer, a via extending through the dielectric layer, a conductor formed on the dielectric layer and a resistive annular ring having a predetermined resistance value. The resistive annular ring may be formed around the via and may be electrically coupled between the via and the conductor.
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Moore Roy Stuart
Welbon Edward Hugh
Curran Stephen J.
Kivlin B. Noäl
Meyertons Hood Kivlin Kowert & Goetzel P.C.
Tu Christine T.
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