Test system having a master/slave JTAG controller

Details Test system having a master/slave JTAG controller Test system having a master/slave JTAG controller

2005-09-27

2010-10-19

Kerveros, James C (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

07818640

ABSTRACT:
A test system has a package containing a number of die. There is a JTAG controller for each of the die. There is also master/slave selector input for each of the JTAG controllers. A boundary scan register link connects at least two of the die.

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