Test system and method for testing electronic devices using...

Details Test system and method for testing electronic devices using... Test system and method for testing electronic devices using...

2006-02-17

2010-06-22

Ellis, Kevin L (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S724000, C714S736000, C714S742000

Reexamination Certificate

active

07743304

ABSTRACT:
A test system for performing tests on devices under test (DUTs) includes a storage device storing test data for performing the tests on the DUTs, a shared processor for generating the test data, storing the test data in the storage device and generating a test control signal including one or more test instructions for executing the tests, and, for each DUT, a dedicated processor configured to receive a test control signal from the shared processor, and in response to the test control signal, transfer the test data for one of the test instructions to the DUT to execute that test instruction and verify the completion of that test instruction.

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PCT International Search Report and Written Opinion Dated Jul. 18, 2007 for International Application No. PCT/EP2007/001376.

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