Test system and method for testing a circuit

Details Test system and method for testing a circuit Test system and method for testing a circuit

2007-10-09

2007-10-09

Chung, Phung My (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S703000, C714S742000, C714S733000

Reexamination Certificate

active

11215389

ABSTRACT:
A test-device for testing an electric circuit comprises a data stream generator for generating a first data stream to be fed to an electric circuit which generates a second data stream in response to the first data stream and a comparison-device for comparing two data streams. The test-device comprises further a self-test device configured to generate a third data stream used to test the comparison-device. The test-device is further configured to operate in a first operation mode and in a second operation mode. The comparison-device is configured to compare the first data stream with the second data stream during the first operation mode and is configured to compare the first data stream with the third data stream during the second operation mode.

REFERENCES:
patent: 4092589 (1978-05-01), Chau et al.
patent: 4497056 (1985-01-01), Sugamori
patent: 4542505 (1985-09-01), Binoeder et al.
patent: 6556037 (2003-04-01), Shiraishi
patent: 6753693 (2004-06-01), Seo et al.
patent: 7079612 (2006-07-01), Tarng

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