Test system and back annotation method

Details Test system and back annotation method Test system and back annotation method

2011-07-05

2011-07-05

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S033000, C714S037000, C714S038110, C714S702000, C714S724000, C714S738000, C703S013000, C703S022000, C703S027000, C703S028000, C703S004000, C716S132000, C716S136000

Reexamination Certificate

active

07975198

ABSTRACT:
A test system for performing a test of a device is provided that comprises a source file of a test plan that describes a program for performing a test, and one or more of elements that are formed in a unit that divides the source file into one or more blocks. The test system further comprises an annotatable object that, when debugging of objects of the source file is performed, manages modification details of the debugging with reference to an element corresponding to a portion where the debugging is performed, and a controller that, after the debugging, rewrites the source file with details after the debugging is performed on an element basis based on the element and the annotatable object.

REFERENCES:
patent: 7069526 (2006-06-01), Schubert et al.
patent: 7209851 (2007-04-01), Singh et al.
patent: 7437614 (2008-10-01), Haswell et al.
patent: 7694249 (2010-04-01), Hamilton et al.
patent: 2002/0046364 (2002-04-01), Yoshimura
patent: 2009/0119542 (2009-05-01), Nagashima et al.

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