Test program set generation tool

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Reexamination Certificate

active

07376876

ABSTRACT:
A test specification and test program set for a given unit under test and a given automated test equipment platform is generated in an automated manner using information stored in a repository.

REFERENCES:
patent: 4542505 (1985-09-01), Binoeder et al.
patent: 4577318 (1986-03-01), Whitacre et al.
patent: 4620302 (1986-10-01), Binoeder et al.
patent: 4701916 (1987-10-01), Naven et al.
patent: 4853928 (1989-08-01), Williams
patent: 4926363 (1990-05-01), Nix
patent: 4932028 (1990-06-01), Katircioglu et al.
patent: 5218325 (1993-06-01), Trelewicz et al.
patent: 5323108 (1994-06-01), Marker, III et al.
patent: 5369604 (1994-11-01), Ravindranath et al.
patent: 5390194 (1995-02-01), Mannle
patent: 5418792 (1995-05-01), Maamari
patent: 5548525 (1996-08-01), Albee et al.
patent: 5633813 (1997-05-01), Srinivasan
patent: 5657240 (1997-08-01), Chakradhar et al.
patent: 5677913 (1997-10-01), Aybay
patent: 5684808 (1997-11-01), Valind
patent: 5715373 (1998-02-01), Desgrousilliers et al.
patent: 5812436 (1998-09-01), Desgrousilliers et al.
patent: 5850511 (1998-12-01), Stoecker et al.
patent: 5875196 (1999-02-01), Chakradhar et al.
patent: 5892947 (1999-04-01), DeLong et al.
patent: 5913023 (1999-06-01), Szermer
patent: 6112020 (2000-08-01), Wright
patent: 6128759 (2000-10-01), Hansen
patent: 6178533 (2001-01-01), Chang
patent: 6182258 (2001-01-01), Hollander
patent: 6219809 (2001-04-01), Noy
patent: 6334200 (2001-12-01), Fujiwara et al.
patent: 6341361 (2002-01-01), Basto et al.
patent: 6347388 (2002-02-01), Hollander
patent: 6353904 (2002-03-01), Le
patent: 6378096 (2002-04-01), Chakradhar et al.
patent: 6449744 (2002-09-01), Hansen
patent: 6519727 (2003-02-01), Noy
patent: 6523151 (2003-02-01), Hekmatpour
patent: 6546506 (2003-04-01), Lewis
patent: 6631344 (2003-10-01), Kapur et al.
patent: 6675138 (2004-01-01), Hollander et al.
patent: 6684359 (2004-01-01), Noy
patent: 6701313 (2004-03-01), Smith
patent: 6711134 (2004-03-01), Wichelman et al.
patent: 6714032 (2004-03-01), Reynick
patent: 2002/0073374 (2002-06-01), Danialy et al.
patent: 2005/0097515 (2005-05-01), Ribling
patent: 05150009 (1993-06-01), None

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