Test pattern generator for memories having a block write functio

Details Test pattern generator for memories having a block write functio Test pattern generator for memories having a block write functio

1998-10-20

2000-02-29

Nguyen, Hoa T.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

714738, 714742, 714743, 714718, G01R 3128

Patent

active

060322810

ABSTRACT:
A test pattern generator for performing a block write function testing at high speed. The test pattern generator includes a data register which takes in data signal from a data generator by a first write signal from a control signal generator, an address selector which takes in specific bits from an address generated by an address generator, a mask data register file which takes the data signal in an area specified by a second write signal from the control signal generator, a write data register file which takes the data signal in an area specified by a third write signal from the control signal generator, and data formatter which outputs either an output data of the data register or of the data generator based on the above signals.

REFERENCES:
patent: 4369511 (1983-01-01), Kimura et al.
patent: 4370746 (1983-01-01), Jones et al.
patent: 4958345 (1990-09-01), Fujisaki
patent: 5453995 (1995-09-01), Behrens
patent: 5668816 (1997-09-01), Douskey et al.
patent: 5856985 (1999-01-01), Fujisaki

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