Test circuit and method for multilevel cell flash memory

Details Test circuit and method for multilevel cell flash memory Test circuit and method for multilevel cell flash memory

2011-05-10

2011-05-10

Kerveros, James C (Department: 2117)

Active solid-state devices (e.g., transistors, solid-state diode

Field effect device

Having insulated electrode

C257S360000, C327S310000

Reexamination Certificate

active

07939892

ABSTRACT:
A test device and method may be used to detect voltage, current or signals of a digital multilevel memory cell system or to test operation or performance by applying inputted voltages, currents or signals to the memory cell system.

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