Test apparatus, computer readable program for test...

Details Test apparatus, computer readable program for test... Test apparatus, computer readable program for test...

2004-06-01

2008-11-18

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S718000, C714S724000

Reexamination Certificate

active

07454679

ABSTRACT:
A test apparatus for testing a device under test includes a plurality of conversion processing units for converting split patterns recorded respectively on different split pattern recording sections in parallel, and a test pattern generating unit for providing a test pattern converted by the plurality of conversion processing units to the device under test, wherein a test pattern file used for testing the device under test includes a plurality of the split pattern recording sections where a plurality of the split patterns are recorded, and the test pattern for testing the device under test is split into the split patterns.

REFERENCES:
patent: 4493045 (1985-01-01), Hughes, Jr.
patent: 4875210 (1989-10-01), Russo et al.
patent: 5923678 (1999-07-01), Ishibashi
patent: 6108806 (2000-08-01), Abramovici et al.
patent: 6226765 (2001-05-01), Le et al.
patent: 6331770 (2001-12-01), Sugamori
patent: 6560756 (2003-05-01), Necoechea et al.
patent: 6661839 (2003-12-01), Ishida et al.
patent: 6754868 (2004-06-01), Bristow et al.
patent: 6922803 (2005-07-01), Nakao et al.
patent: 2001/0054131 (2001-12-01), Alvarez et al.
patent: 2002/0101367 (2002-08-01), Geiger et al.
patent: 2002/0104049 (2002-08-01), Park et al.
patent: 2002/0184579 (2002-12-01), Alvarez et al.
patent: 2003/0005381 (2003-01-01), Bristow et al.
patent: 2003/0025519 (2003-02-01), Hsieh
patent: 2003/0061457 (2003-03-01), Geiger et al.
patent: 2004/0064771 (2004-04-01), Appinger et al.
patent: 2007/0011530 (2007-01-01), Rajski et al.
patent: 0 909 037 (1999-04-01), None
patent: 59-92367 (1984-05-01), None
patent: 61-274280 (1986-12-01), None
patent: 4-161869 (1992-06-01), None
patent: 9-46629 (1997-02-01), None
patent: 9-298559 (1997-11-01), None
patent: 10-68760 (1998-03-01), None
patent: WO 98/43359 (1998-10-01), None
patent: WO 2004/081593 (2004-09-01), None
European Communication pursuant to Article 96(2) EPC, for patent application No. 04 720 141.3, mailed Feb. 2, 2007, 4 pages.
European Search Report dated Mar. 2, 2006 (3 pages).
International Search Report dated Mar. 2, 2006 (3 pages).
International Search Report dated Jul. 13, 2004 (2 pages).
Patent Abstracts of Japan; Publication No. 09-046629 dated Feb. 14, 1997 (2 pages).
Patent Abstracts of Japan; Publication No. 59-092367 dated May 28, 1984 (2 pages).
Patent Abstracts of Japan; Publication No. 04-161869 dated Jun. 5, 1992 (2 pages).
Patent Abstracts of Japan; Publication No. 61-274280 dated Dec. 4, 1986 (2 pages).
Patent Abstracts of Japan; Publication No. 09-298559 dated Nov. 18, 1997 (2 pages).
Patent Abstracts of Japan; Publication No. 10-068760 dated Mar. 10, 1998 (2 pages).

Affiliated with

Also associated with

Rating

Test apparatus, computer readable program for test... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test apparatus, computer readable program for test..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test apparatus, computer readable program for test... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4033427