Test apparatus and writing control circuit

Details Test apparatus and writing control circuit Test apparatus and writing control circuit

2007-05-22

2007-05-22

Kerveros, James C (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S744000

Reexamination Certificate

active

10938407

ABSTRACT:
A writing control circuit for writing command data supplied from a plurality of host computers onto any of a plurality of register sections, the writing control circuit includes a plurality of request signal storing sections, a host selecting section, and a writing section. The plurality of request signal storing sections correspond to the plurality of host computers and store writing request signals supplied from the corresponding host computers. The host selecting section sequentially selects the request signal storing sections, and receives and outputs data being stored by the selected request signal storing sections. The writing section receives the stored data output by the host selecting section, the command data, and register section specifying data.

REFERENCES:
patent: 6754868 (2004-06-01), Bristow et al.
patent: 6785858 (2004-08-01), Niiro
patent: 3-18951 (1991-01-01), None
patent: 5-127850 (1993-05-01), None
patent: 11-304888 (1999-11-01), None
patent: 2001-512255 (2001-08-01), None
Japanese International Search Report and Written Opinion dated Dec. 28, 2004 (7 pages).
Patent Abstracts of Japan; Publication No. 05-127850 dated May 25, 1993 (1 page).
Patent Abstracts of Japan; Publication No. 03-018951 dated Jan. 28, 1991 (1 page).
Patent Abstracts of Japan; Publication No. 11-304888 dated Nov. 5, 1999 (1 page).

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