Test apparatus and testing method

Details Test apparatus and testing method Test apparatus and testing method

2007-08-28

2007-08-28

Kerveros, James C. (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S744000

Reexamination Certificate

active

10938857

ABSTRACT:
A test apparatus for testing electronic devices is provided which includes a plurality of signal sources to supply an output signal to test electronic devices according to an input signal, a loop circuit to make the output signal loop and to input the looped signal to each of the signal sources having output the output signal as an input signal, a counter section to measure a period between inputting of the input signal and inputting the looped signal in each of the signal sources, and a controlling section to control timing at which each of the signal sources supplies the output signal so that a period measured by the counter section in each of the signal sources be substantially same.

REFERENCES:
patent: 6785858 (2004-08-01), Niiro
patent: 61-176871 (1986-08-01), None
patent: 6-51027 (1994-02-01), None
patent: 10-197611 (1998-07-01), None
patent: 2002-139556 (2002-05-01), None
Japanese International Search Report and Written Opinion dated Dec. 28, 2004 (7 pages).
Patent Abstracts of Japan; Publication No. 10-197611 dated Jul. 31, 1998 (1 page).
Patent Abstracts of Japan; Publication No. 2002-139556 dated May 17, 2002 (1 page).
Patent Abstracts of Japan; Publication No. 06-051027 dated Feb. 25, 1994 (1 page).
Patent Abstracts of Japan; Publication No. 61-176871 dated Aug. 8, 1986 (1 page).

Affiliated with

Also associated with

Rating

Test apparatus and testing method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test apparatus and testing method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test apparatus and testing method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3892774