Test apparatus and test method

Details Test apparatus and test method Test apparatus and test method

2006-10-27

2009-12-08

Ellis, Kevin L (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S738000, C714S744000, C365S201000, C324S765010, C326S016000

Reexamination Certificate

active

07631234

ABSTRACT:
The present test apparatus avoids proximity restriction violation of an edge and surely generates a test signal. There is provided a test apparatus that tests a device under test. The test apparatus includes a test pattern generating section that generates a test pattern to test the device under test every test period, a plurality of edge generators that respectively generate an edge of a test signal to be supplied to the device under test based on the test pattern every cycle period of a reference clock that is used as a reference for an operation of this test apparatus, a selecting section that selects which edge generator generates each edge of a test signal to be output during the next cycle period based on a pattern of the edge generated during the current cycle period, and a test signal supplying section that supplies the test signal according to each edge generated from the selected edge generator to the device under test.

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