Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-04-13
2009-10-27
Tabone, Jr., John J (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S742000, C714S724000, C324S1540PB, C324S755090, C324S765010
Reexamination Certificate
active
07610538
ABSTRACT:
A test apparatus being capable of replacing a test module with the other kind of test module that tests device under tests by using the test module is provided. The test apparatus includes a plurality of test modules that transmit/receive signals to/from the device under tests to test the device under test; and a performance board for diagnosis that diagnose the plurality of test modules. The performance board for diagnosis including: a motherboard provided common to the plurality of test, modules; a circuit for diagnosis that transmits/receives a signal to/from each test module to diagnose the test module; a plurality of inter-board to module connectors that connect between the corresponding test module and the circuit for diagnosis; andplurality of sub-boards each of which has at least one of the inter-board to module connectors and is fixed to the motherboard to fix the inter-board to module connectors to the motherboard.
REFERENCES:
patent: 5747994 (1998-05-01), Suga
patent: 6452411 (2002-09-01), Miller et al.
patent: 7174490 (2007-02-01), Evans
patent: 7278079 (2007-10-01), Evans
patent: 7362089 (2008-04-01), Kushnick et al.
patent: WO2004086071 (2004-10-01), None
patent: WO2005/114236 (2005-12-01), None
Advantest Corporation
Osha • Liang LLP
Tabone, Jr. John J
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