Test apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Details

C714S030000

Reexamination Certificate

active

10858456

ABSTRACT:
A test apparatus for testing an electronic device, includes a test module for sending and/or receiving a test signal to and/or from the electronic device, a test head including a plurality of Test Head (TH) slots for detachably holding the test module, a diagnosis module for performing diagnosis of the test module, and a coupling device including a plurality of Performance Board (PB) slots being electrically coupled to the TH slots respectively for detachably holding the diagnosis module. The diagnosis module held in one of the PB slots diagnoses the test module held in one of the TH slots being electrically coupled to one of the PB slots.

REFERENCES:
patent: 5525971 (1996-06-01), Flynn
patent: 5705743 (1998-01-01), Leonard et al.
patent: 5938776 (1999-08-01), Sicola et al.
patent: 5999468 (1999-12-01), Lawrence
patent: 6029261 (2000-02-01), Hartmann
patent: 6331770 (2001-12-01), Sugamori
patent: 2006/0090109 (2006-04-01), Bonnet
patent: 6-265594 (1994-09-01), None
patent: 9-184871 (1997-07-01), None
patent: 11-304880 (1999-11-01), None
patent: WO 2004/086071 (2004-10-01), None
International Search Report dated Jul. 6, 2004 (1 page).
Patent Abstracts of Japan; Publication No. 06-265594 dated Sep. 22, 1994 (2 pages).
Patent Abstracts of Japan; Publication No. 09-184871 dated Jul. 15, 1997 (2 pages).
Patent Abstracts of Japan; Publication No. 11-304880 dated Nov. 5, 1999 (2 pages).
International Search Report dated Mar. 2, 2006 (3 pages).

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