Test access port

Details Test access port Test access port

2009-11-03

2011-11-22

Chung, Phung M (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

08065576

ABSTRACT:
A semiconductor chip is described having a plurality of processing cores. The semiconductor chip also includes a plurality of test controllers. Each test controller is associated with a different one of the processing cores. The semiconductor chip also includes a test port having a first serial input and a first serial output. The first serial input is to receive serial test input data provided to the semiconductor chip. The first serial output is to provide serial output data provided by the semiconductor chip. The semiconductor chip further includes switch circuitry coupled to the test port and the plurality of test controllers. The switch circuitry is to route the serial test input data to one of the plurality of test controllers and to route the serial output data from one of the plurality of test controllers to the first serial output. The semiconductor chip further includes a configuration register coupled to the switch circuitry to establish the switch circuitry's routing configuration.

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