Test access port

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07627797

ABSTRACT:
A method, apparatus, and system are provided for testing multi-core processors. The testing includes a test control mechanism and a multi-core processor including a set of cores with at least one core having a test access port controller (TAPC), distributed data, and a set of distributed control registers. The multi-core processor and the test control mechanism further having a configuration to provide testing the multi-core processor. The test control mechanism is modified to simultaneously test multiple cores.

REFERENCES:
patent: 5388265 (1995-02-01), Volk
patent: 5448576 (1995-09-01), Russell
patent: 5644580 (1997-07-01), Champlin
patent: 5809036 (1998-09-01), Champlin
patent: 5862152 (1999-01-01), Handly et al.
patent: 6115763 (2000-09-01), Douskey et al.
patent: 6134675 (2000-10-01), Raina
patent: 6223315 (2001-04-01), Whetsel
patent: 6282636 (2001-08-01), Yeh et al.
patent: 6311302 (2001-10-01), Cassetti et al.
patent: 6324662 (2001-11-01), Haroun et al.
patent: 6378090 (2002-04-01), Bhattacharya
patent: 6381717 (2002-04-01), Bhattacharya
patent: 6385749 (2002-05-01), Adusumilli et al.
patent: 6408413 (2002-06-01), Whetsel
patent: 6412062 (2002-06-01), Xu et al.
patent: 6425100 (2002-07-01), Bhattacharya
patent: 6658615 (2003-12-01), Whetsel
patent: 6686759 (2004-02-01), Swamy
patent: 6701474 (2004-03-01), Cooke et al.
patent: 6711707 (2004-03-01), Haroun et al.
patent: 6918057 (2005-07-01), Brophy et al.
patent: 7003707 (2006-02-01), Whetsel
patent: 7055060 (2006-05-01), Nguyen et al.
patent: 2002/0116438 (2002-08-01), Nguyen et al.
patent: 2002/0138695 (2002-09-01), Beardsley et al.
patent: 2003/0005380 (2003-01-01), Nguyen et al.
patent: 2004/0015669 (2004-01-01), Edirisooriya
patent: 2004/0111566 (2004-06-01), Edirisooriya
patent: 2004/0153611 (2004-08-01), Jamil et al.
patent: 2006/0112238 (2006-05-01), Jamil et al.
patent: 2006/0136925 (2006-06-01), Nguyen et al.
U.S. Appl. No. 10/726,923, filed Dec. 2003, Nguyen et al.
“IEEE Standard Test Access Port and Boundary-Scan Architecture”,IEEE Std. 1149.1-1990, (1993), 86 pgs.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Test access port does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test access port, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test access port will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4140718

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.