Test access port

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Details

C714S030000

Reexamination Certificate

active

07139947

ABSTRACT:
Briefly, descriptions of embodiments in accordance with the invention, a test access port for a multi-core processor.

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IEEE Standard Test Access Port and Boundary-Scan Architecture, IEEE Std. 1149.1-1990, 86 pgs., 1993.
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