Techniques for improving adhesion of silicon dioxide to titanium

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Multiple layers

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438763, 438624, H01L 21443, H01L 21316

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active

056248687

ABSTRACT:
The present invention is described in several embodiments depicted structures and methods to form these structures. A first embodiment is a structure having a silicon dioxide film bonded to a metal film comprising: a metal nitride film bonded to the metal film; and the silicon dioxide film bonded to the metal nitride film. A second embodiment is a structure having a silicon dioxide film bonded to a metal film comprising: a metal oxide film bonded to the metal film; and the silicon dioxide film bonded to the metal oxide film. A third embodiment is a structure having a silicon dioxide film bonded to a metal film comprising: a metal/oxide
itride film bonded to the metal film; and the silicon dioxide film bonded to the metal/oxide
itride film.

REFERENCES:
patent: 3916041 (1975-10-01), Chu et al.
patent: 4350563 (1982-09-01), Takada et al.
patent: 4448633 (1984-05-01), Shuskus
patent: 4462881 (1984-07-01), Yamamoto et al.
patent: 4713260 (1987-12-01), Roberts et al.
patent: 4821085 (1989-04-01), Haken et al.
patent: 4931410 (1990-06-01), Tokunaga et al.
patent: 4931411 (1990-06-01), Tigelaar et al.
patent: 5093710 (1992-03-01), Higuchi
patent: 5130267 (1992-07-01), Kaya et al.
patent: 5202152 (1993-04-01), Giannelis et al.
patent: 5252515 (1993-10-01), Tsai et al.
patent: 5268217 (1993-12-01), Kimock et al.
patent: 5275715 (1994-01-01), Tuttle
patent: 5326724 (1994-07-01), Wei
patent: 5416045 (1995-05-01), Kauffman et al.
patent: 5440167 (1995-08-01), Iranmanesh
Wolf et al., Si Processing for the VLSI Era, Lattice Press, 1986.
Aronson, Arnold, `The Principles of Sputtering Eq.`, Material Research Corp., 1993.
Ghandhi, Sorab K., `VLSI Fabrication Principles`, New York 1987.
Wolf, Stanley `Si Proc. For VLSI Era` vol. II Lattice Press (1990).

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