Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2007-01-22
2008-03-25
Sarkar, Asok K. (Department: 2891)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S614000, C438S618000, C438S598000, C257SE21590
Reexamination Certificate
active
07348270
ABSTRACT:
A method for forming interconnects onto attachment points of a wafer includes the steps of providing a mold with a plurality of cavities having a predetermined shape, depositing a release agent on surfaces of the cavities, filling the cavities with an interconnect material to form the interconnects, removing the release agent from the mold, and attaching the interconnects to the attachment points of the wafer. An adhesive layer can optionally be deposited in addition to the release layer. The adhesive layer can be used, for example, to bond the chip to a package.
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patent: 2007/0045515 (2007-03-01), Farnworth et al.
Danovitch David H.
Farooq Mukta G.
Gruber Peter A.
Knickerbocker John U.
Proto George R.
Morris, Esq. Daniel P.
Ryan & Mason & Lewis, LLP
Sarkar Asok K.
Yevsikov Victor V.
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