Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-02-20
2007-02-20
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
10625505
ABSTRACT:
Techniques for optimizing the placement and synthesis of a circuit design on a programmable integrated circuit are provided. The performance of a circuit design is analyzed after it has been compiled with different values for selected input parameters. The input parameter values that produce the best results for an output metric are then chosen to synthesis and place the circuit design on the programmable integrated circuit. In one embodiment, the values of the output metrics are averaged for all test compiles that share the same input parameters, but different seeds. In another embodiment, the compile with the best output metrics, as determined by the user, are selected. These techniques allow a user to automatically trade off compile-time to get a better-optimized circuit.
REFERENCES:
patent: 4882690 (1989-11-01), Shinsha et al.
patent: 5550839 (1996-08-01), Buch et al.
patent: 6026226 (2000-02-01), Heile et al.
patent: 6308313 (2001-10-01), Lakshminarayana et al.
patent: 6651235 (2003-11-01), Dai et al.
patent: 6691286 (2004-02-01), McElvain et al.
patent: 6721924 (2004-04-01), Patra et al.
patent: 2003/0229728 (2003-12-01), Hodges
patent: 2004/0261052 (2004-12-01), Perry et al.
Hutton, “Characterization and Automatic Generation of Benchmark Circuits,” Ph.D. Thesis, University of Toronto, chapters 1-3 (1997).
Karchmer et al. sweeper.tcl version 2.3 beta, Altera Corporation San Jose, CA (2002).
“Introduction to Quartus® II,” product information Altera Corporation San Jose, CA (2003).
Baeckler Gregg
Betz Vaughn
Borer Terry
Brown Stephen
Chan Kevin
Altera Corporation
Dinh Paul
Doan Nghia M.
Townsend & Townsend & Crew LLP
LandOfFree
Techniques for automated sweeping of parameters in... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Techniques for automated sweeping of parameters in..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Techniques for automated sweeping of parameters in... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3873283