TAP with select output from one of IR and DR

Details TAP with select output from one of IR and DR TAP with select output from one of IR and DR

2010-08-03

2011-10-11

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S726000

Reexamination Certificate

active

08037386

ABSTRACT:
A TAP linking module (21, 51) permits plural TAPs (TAPs1-4) to be controlled and accessed from a test bus (13) via a single TAP interface (20).

REFERENCES:
patent: 4315313 (1982-02-01), Armstrong et al.
patent: 5056093 (1991-10-01), Whetsel
patent: 6539497 (2003-03-01), Swoboda et al.
Ruparel, K.N.; Chin, C.; Fitzgerald, J.;, “A vertically integrated test methodology based on JTAG IEEE 1149.1 Standard Interface,” ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International, vol., No., pp. P11-4/1-4, Sep. 23-27, 1991 doi: 10.1109/ASLC.1991.242912.

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