Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2010-10-07
2011-11-08
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S729000
Reexamination Certificate
active
08055967
ABSTRACT:
An IC includes an IEEE 1149.1 standard test access port (TAP) interface and an additional Off-Chip TAP interface. The Off-Chip TAP interface connects to the TAP of another IC. The Off Chip TAP interface can be selected by a TAP Linking Module on the IC.
REFERENCES:
patent: 6073254 (2000-06-01), Whetsel
patent: 6311302 (2001-10-01), Cassetti et al.
patent: 6324662 (2001-11-01), Haroun et al.
patent: 6334198 (2001-12-01), Adusumilli et al.
patent: 6408413 (2002-06-01), Whetsel
patent: 7058862 (2006-06-01), Whetsel et al.
Vermeulen, B.; Waayers, T.; Bakker, S.; , “IEEE 1149.1-compliant access architecture for multiple core debug on digital system chips,” Test Conference, 2002. Proceedings. International , vol., no., pp. 55-63, 2002 doi: 10.1109/TEST.2002.1041745 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1041745&isnumber=22329.
Marinissen, E.J.; et al. , “A structured and scalable mechanism for test access to embedded reusable cores,” Test Conference, 1998. Proceedings., International , vol., no., pp. 284-293, Oct. 18-23, 1998doi: 10.1109/TEST.1998.743166 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=743166&isnumber=15907.
Bhattacharya, D.; , “Hierarchical test access architecture for embedded cores in an integrated circuit,” VLSI Test Symposium, 1998. Proceedings. 16th IEEE , vol., no., pp. 8-14, Apr. 26-30, 1998 doi: 10.1109/VTEST.1998.670842 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=670842&isnumber=14777.
Whetsel, L.; , “An IEEE 1149.1 based test access architecture for ICs with embedded cores,” Test Conference, 1997. Proceedings., International , vol., no., pp. 69-78, Nov. 1-6, 1997 doi: 10.1109/TEST.1997.639596 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=639596&isnumber=13797.
Bassuk Lawrence J.
Brady W. James
Britt Cynthia
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
LandOfFree
TAP interface outputs connected to TAP interface inputs does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with TAP interface outputs connected to TAP interface inputs, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and TAP interface outputs connected to TAP interface inputs will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4266039