Tap and test controller with separate enable inputs

Details Tap and test controller with separate enable inputs Tap and test controller with separate enable inputs

2006-12-26

2006-12-26

Tu, Christine T. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S734000

Reexamination Certificate

active

07155646

ABSTRACT:
Functional circuits and cores of circuits are tested on integrated circuits using scan paths. Using parallel scan distributor and collector circuits for these scan paths improves test access of circuits and cores embedded within ICs and reduces the IC's power consumption during scan testing. A controller for the distributor and collector circuits includes a test control register, a test control state machine and a multiplexer. These test circuits can be connected in a hierarchy or in parallel. A conventional test access port or TAP can be modified to work with the disclosed test circuits.

REFERENCES:
patent: 5546406 (1996-08-01), Gillenwater et al.
patent: 5768289 (1998-06-01), James
patent: 6070252 (2000-05-01), Xu et al.
patent: 6163864 (2000-12-01), Bhavsar et al.
patent: 6173428 (2001-01-01), West
patent: 6378090 (2002-04-01), Bhattacharya

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