TAP and shadow port operating on rising and falling TCK

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S729000

Reexamination Certificate

active

08006151

ABSTRACT:
The disclosure describes a novel method and apparatus for providing a shadow access port within a device. The shadow access port is accessed to perform operations in the device by reusing the TDI, TMS, TCK and TDO signals that are used to operate a test access port within the device. The presence and operation of the shadow access port is transparent to the presence and operation of the test access port. According to the disclosure, the shadow access port operates on the falling edge of the TCK signal while the test access port conventionally operates on the rising edge of the TCK signal.

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Yuejian Wu; Liviu Calin; , “Shadow write and read for at-speed BIST of TDM SRAMs,” Test Conference, 2001. Proceedings. International , vol., No., pp. 985-994, 2001 doi: 10.1109/TEST.2001.966723 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=966723&isnumber=20866.
Joshi, R.N.; Williams, K.L.; Whetsel, L.; , “Evolution of IEEE 1149.1 addressable shadow protocol devices,” Test Conference, 2003. Proceedings. ITC 2003. International , vol. 2, No., pp. 160-166 vol. 2, Sep. 30-Oct. 2, 2003 doi: 10.1109/TEST.2003.1271206 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1271206&isnumber=28462.

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