Systems, methods, and apparatus for total coverage analysis...

Details Systems, methods, and apparatus for total coverage analysis... Systems, methods, and apparatus for total coverage analysis...

2011-02-08

2011-02-08

Chiang, Jack (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

Reexamination Certificate

active

07886242

ABSTRACT:
In some embodiments of the invention, a method and apparatus of consolidating all types of coverage metrics, obtained from an HDL simulator, under a single common framework is described. In other embodiments of the invention, a method and an apparatus are disclosed for performing ranking from a verification plan using total coverage metric.

REFERENCES:
patent: 5604895 (1997-02-01), Raimi
patent: 6990438 (2006-01-01), Chowdhury et al.
patent: 2003/0188224 (2003-10-01), Decker
patent: 2003/0229889 (2003-12-01), Kuzmin et al.
patent: 2004/0216023 (2004-10-01), Maoz et al.
patent: 2004/0255275 (2004-12-01), Czerwonka
patent: 2005/0278576 (2005-12-01), Hekmatpour
patent: 2006/0048026 (2006-03-01), Fine et al.
patent: 2006/0107141 (2006-05-01), Hekmatpour
patent: 2008/0307263 (2008-12-01), Coulter et al.
patent: 2010/0070940 (2010-03-01), Bist et al.

Affiliated with

Also associated with

Rating

Systems, methods, and apparatus for total coverage analysis... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Systems, methods, and apparatus for total coverage analysis..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Systems, methods, and apparatus for total coverage analysis... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2637009