Systems and methods of test case generation with feedback

Details Systems and methods of test case generation with feedback Systems and methods of test case generation with feedback

2004-11-12

2009-10-06

Lamarre, Guy J (Department: 2112)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S741000, C714S739000, C703S013000, C703S014000, C703S015000

Reexamination Certificate

active

07600169

ABSTRACT:
Systems and methods for implementing test case generation with feedback are disclosed. An exemplary system for test case generation with feedback comprises a plurality of knobs identifying test values for a device under test. A plurality of buckets is each associated with at least one of the test values, each bucket having a weight value for the associated test value. A failure analysis module is operatively associated with the device under test, the failure analysis module changing at least some weight values based on feedback from test operations for the device under test. A test case generator selects test values for test operations based on the weight value for the associated test value.

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patent: 2002/0156608 (2002-10-01), Armbruster et al.
patent: 2006/0070035 (2006-03-01), Ulrich et al.

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