Systems and methods for forming zirconium and/or...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S287000, C438S256000, C438S785000

Reexamination Certificate

active

07112485

ABSTRACT:
A method of forming (and apparatus for forming) a zirconium and/or hafnium-containing layer on a substrate, particularly a semiconductor substrate or substrate assembly, using a vapor deposition process and one or more silicon precursor compounds of the formula Si(OR)4with one or more zirconium and/or hafnium precursor compounds of the formula M(NR′R″)4, wherein R, R′, and R″ are each independently an organic group and M is zirconium or hafnium.

REFERENCES:
patent: 5195018 (1993-03-01), Kwon et al.
patent: 6020243 (2000-02-01), Wallace et al.
patent: 6040594 (2000-03-01), Otani
patent: 6060755 (2000-05-01), Ma et al.
patent: 6203613 (2001-03-01), Gates et al.
patent: 6221712 (2001-04-01), Huang et al.
patent: 6273951 (2001-08-01), Vaartstra
patent: 6300203 (2001-10-01), Buynoski et al.
patent: 6313035 (2001-11-01), Sandhu et al.
patent: 6313233 (2001-11-01), Kurosawa et al.
patent: 6316064 (2001-11-01), Onozawa et al.
patent: 6335049 (2002-01-01), Basceri
patent: 6541280 (2003-04-01), Kaushik et al.
patent: 6573182 (2003-06-01), Sandhu
patent: 6586792 (2003-07-01), Ahn et al.
patent: 6674169 (2004-01-01), Sandhu
patent: 6869638 (2005-03-01), Baum et al.
patent: 6884675 (2005-04-01), Chung et al.
patent: 6884719 (2005-04-01), Chang et al.
patent: 2001/0023120 (2001-09-01), Tsunashima et al.
patent: 2001/0024387 (2001-09-01), Raaijmakers et al.
patent: 2001/0041374 (2001-11-01), Hintermaier et al.
patent: 2001/0053615 (2001-12-01), Lim
patent: 2002/0175393 (2002-11-01), Baum et al.
patent: 2002/0187644 (2002-12-01), Baum et al.
patent: 2003/0113480 (2003-06-01), Kil et al.
patent: 2003/0213987 (2003-11-01), Basceri et al.
patent: 2004/0043149 (2004-03-01), Gordon et al.
patent: 2004/0046197 (2004-03-01), Basceri et al.
patent: 2005/0054213 (2005-03-01), Derderian et al.
patent: 2005/0070126 (2005-03-01), Senzaki
patent: 1 048 627 (2000-11-01), None
patent: 1 166 900 (2002-01-01), None
patent: 1 193 309 (2002-04-01), None
patent: 5-239650 (1993-09-01), None
patent: 2001 108199 (2001-04-01), None
patent: 2002 060944 (2002-02-01), None
patent: 2003 347297 (2003-12-01), None
patent: WO 95/26355 (1995-10-01), None
patent: WO 02/27063 (2002-04-01), None
patent: WO 04/020689 (2004-03-01), None
patent: WO 04/020690 (2004-03-01), None
patent: WO 04/020691 (2004-03-01), None
Gordon et al., Vapor Deposition of Metal Oxides and Silicates: Possible Gate Insulators for Future Microelectronics,Chem. Mater., 2001; 13:2463-4. Available online Jul. 10, 2001.
Hawley,The Condensed Chemical Dictionary, 10thEdition, Van Nostrand Reinhold Co., New York, 1981; 225-226.
Hiltunen et al., “Growth and characterization of aluminium oxide thin films deposited from various source materials by atomic layer epitaxy and chemical vapor deposition processes,”Materials Chemistry and Physics, 1991; 28:379-388.
Jeon et al., “Atomic Layer Deposition of Al2O3Thin Films Using Trimethylaluminum and Isopropyl Alcohol,”Journal of the Electrochemical Society, 2002; 149(6):C306-C310. Available online Apr. 12, 2002.
Killworth, “What is a patent?”Vacuum Technology&Coating, May 2002; pp. 32-34, 36-39.
Qi et al., “Ultrathin Zirconium silicate film with good thermal stability for alternative gate dielectric application,”Applied Physics Letters, Sep. 11, 2000; 77(11):1704-6.
Ritala et al., “Atomic Layer Deposition of Oxide Thin Films with Metal Alkoxides as Oxygen Sources,”Science, 2000; 288:319-21.
Wilk et al., “Hafnium and zirconium silicates for advanced gate dielectrics,”Journal of Applied Physics, Jan. 1, 2000; 87(1):484-92.
Vehkamäki et al., “Growth of SrTiO3and BaTiO3Thin Films by Atomic Layer Deposition,”Electrochemical and Solid-State Letters, 1999; 2(10):504-6.
Vioux, “Nonhydrolytic Sol-Gel Routes to Oxides,”Chem. Mater., 1997; 9(11):2292-9.
Hendrix et al., “Comparison of MOCVD precursors for Hf/sub 1-x/Si/Sub x/O/sub 2/gate dielectric deposition,”Silicon Materials-Processing, Characterization and Reliability Symposium(Mater. Res. Soc. Proc.), Apr. 2002;716: 273-278.

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