Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-05-09
2006-05-09
Tu, Christine T. (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C324S763010, C326S082000
Reexamination Certificate
active
07043674
ABSTRACT:
Methods for testing integrated circuits (ICs) are provided. An embodiment of a method comprises: electrically interconnecting automated test equipment (ATE) with the IC; providing at least one stimulus such that the IC determines the presence of a leakage current of the first pad; and receiving information corresponding to the leakage current of the first pad. Systems also are provided.
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Rearick Jeffrey R.
Rohrbaugh John G.
Shepston Shad
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