Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-04-29
2008-07-15
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07401302
ABSTRACT:
A method is disclosed for designing a semiconductor circuit on a multi-project wafer (MPW). One or more standard modules designed by one or more vendors with verified functions are first identified. Some of the standard modules are charged based on usage. At least one reconfigurable module of the MPW is programmed by making one or more connections through one or more connection layers. The standard modules are further connected with the programmed reconfigurable module according to the predetermined design of the circuit. The completed circuit is then verified for final uses.
REFERENCES:
patent: 6237132 (2001-05-01), Dean et al.
patent: 2005/0257177 (2005-11-01), Chen et al.
Chen Kun-Lung
Chung Shine Chien
Hou Yung-Chin
Wu Yu-Chun
Dinh Paul
Kirkpatrick & Lockhart Preston Gates & Ellis LLP
Taiwan Semiconductor Manufacturing Company , Ltd.
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