Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2011-03-08
2011-03-08
Doan, Nghia M (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07904844
ABSTRACT:
An automated system for checking an integrated circuit cell layout includes searching the cell layout for a sub-area containing a predefined identifier, determining a reference cell layout corresponding to the predefined identifier, verifying the cell layout by comparing the cell layout to the reference cell layout to determine if a cell is of concern, and reporting the cell of concern to a user.
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Chang Feng-Ming
Chang Gwan Sin
Wang Ping-Wei
Yeh Cheng-Hung
Doan Nghia M
Haynes and Boone LLP
Taiwan Semiconductor Manufacturing Company , Ltd.
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