Radiant energy – Inspection of solids or liquids by charged particles – Positive ion probe or microscope type
Reexamination Certificate
2008-05-13
2008-05-13
Kim, Robert (Department: 2881)
Radiant energy
Inspection of solids or liquids by charged particles
Positive ion probe or microscope type
C250S306000
Reexamination Certificate
active
07372026
ABSTRACT:
A system for repositioning a microfabricated cantilever includes a microfabricated cantilever, a first device operable to detect a position of the microfabricated cantilever, and a second device. The first device is operable to determine an offset in the position of the microfabricated cantilever, and the second device is operable to reposition the microfabricated cantilever based on an offset detected by the first device.
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Birecki Henryk
Chaiken Alison
Hewlett--Packard Development Company, L.P.
Johnston Phillip A.
Kim Robert
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