Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-10-30
2007-10-30
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
11082592
ABSTRACT:
A method for verifying a digital system design is provided. A first abstraction of a digital system design is performed to obtain an abstract model of the digital system design. One or more first steps of a multiple-step model checking process are performed using the abstract model, the multiple-step model checking process being operable to verify the digital system design. During the multiple-step model checking process, a second abstraction is performed to refine the abstract model. One or more second steps of the multiple-step model checking process are then performed using the refined abstract model.
REFERENCES:
patent: 5953519 (1999-09-01), Fura
patent: 6643827 (2003-11-01), Yang
patent: 6728939 (2004-04-01), Johannsen
patent: 6957404 (2005-10-01), Geist et al.
patent: 2004/0153308 (2004-08-01), McMillan et al.
patent: 2005/0086648 (2005-04-01), Andrews et al.
patent: 2005/0114809 (2005-05-01), Lu
patent: 2005/0210433 (2005-09-01), Clarke et al.
patent: 2006/0190864 (2006-08-01), Ganai et al.
Gupta, A., et al. “Iterative Abstraction using SAT—Based BMC with Proof Analysis”, ICCAD '03, Nov. 11-13, pp. 416-423.
Baker & Botts LLP
Dimyan Magid Y.
Fujitsu Limited
Siek Vuthe
LandOfFree
System and method for verifying a digital design using... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for verifying a digital design using..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for verifying a digital design using... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3899889