Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-03-08
2010-02-23
Ellis, Kevin L (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S715000
Reexamination Certificate
active
07669100
ABSTRACT:
In an integrated circuit having a plurality of modules and/or submodules that each performs a substantially same function, defective modules and/or submodules are determined by creating a test signature from an input test pattern. The output of each module and/or submodule is compared with the test signature and defective modules to identify defective modules and/or submodules. The identity of defective modules/submodules is stored on the integrated circuit for subsequent use by a customer. Integrated circuits having one or more defective modules/submodules are sold to customers with full disclosure of which modules/submodules are defective, thereby improving the yield associated with the product. Pricing of the product is discounted for products with less than full functionality.
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Ellis Kevin L
Freescale Semiconductor Inc.
Gandhi Dipakkumar
Hill Susan C.
King Robert L.
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