System and method for testing a circuit

Details System and method for testing a circuit System and method for testing a circuit

2005-05-19

2010-11-16

Rizk, Sam (Department: 2112)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S030000, C714S727000, C714S728000

Reexamination Certificate

active

07836365

ABSTRACT:
Systems and methods for testing a circuit are provided. In one example, a sequential device for use in a scan chain is described. The sequential device may include a scan input, a scan output and a functional data output. The functional data output may be coupled to the scan input and to the scan output. The functional data output may be coupled to the scan output via a delay buffer.

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