System and method for testing a circuit

Details System and method for testing a circuit System and method for testing a circuit

2005-11-22

2005-11-22

Dildine, R. Stephen (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

06968488

ABSTRACT:
Systems and methods for testing a circuit are provided. In one example, a sequential device for use in a scan chain is described. The sequential device may include a scan input, a scan output and a functional data output. The functional data output may be coupled to the scan input and to the scan output. The functional data output may be coupled to the scan output via a delay buffer.

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