Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-08-28
2007-08-28
Nhu, David (Department: 2818)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S289000, C438S381000, C257SE21577, C257SE21646
Reexamination Certificate
active
11146126
ABSTRACT:
A semiconductor device includes a substrate, a memory cell formed on the substrate, and a contact to the substrate. The contact is formed in an area away from the memory cell and functions to raise the potential of the substrate.
REFERENCES:
patent: 4734384 (1988-03-01), Tsuchiya
patent: 4786954 (1988-11-01), Morie et al.
patent: 4830978 (1989-05-01), Teng et al.
patent: 5021854 (1991-06-01), Huth
patent: 5200353 (1993-04-01), Inuishi
patent: 5286982 (1994-02-01), Ackley et al.
patent: 5978258 (1999-11-01), Manning
patent: 6291307 (2001-09-01), Chu et al.
patent: 6635528 (2003-10-01), Gilbert et al.
2002 IEEE International Solid-State Circuits Conference, Session 6, “SRAM and Non-Volatile Memories,” Feb. 4, 2004, 6 pages.
2002 IEEE International Solid-State Circuits Conference, 23 pages.
Liu Zhizheng
Martirosian Ashot Melik
Randolph Mark
Harrity & Snyder LLP
Nhu David
Spansion LLC
LandOfFree
System and method for reducing process-induced charging does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for reducing process-induced charging, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for reducing process-induced charging will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3889134