System and method for operation verification of...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000

Reexamination Certificate

active

11138499

ABSTRACT:
A system for operation verification of a semiconductor integrated circuit has a central processing unit, a design layout memory unit storing design layout information including the design layout configuration of the semiconductor integrated circuit, and a predicted final layout memory storing a predicted final layout configuration predicted by the central processing unit by adding an optical proximity effect to the design layout configuration. The system further has a netlister which describes a procedure for causing the central processing unit to produce a plurality of net lists in which different physical values are registered for a common element in the predicted final layout configuration, a netlist memory unit the plurality of net lists, and a circuit simulator which describes a procedure for causing the central processing unit to perform operation verification of the semiconductor integrated circuit by using an arbitrary one of the plurality of net lists.

REFERENCES:
patent: 6425113 (2002-07-01), Anderson et al.
patent: 6898561 (2005-05-01), Liu et al.
patent: 6931617 (2005-08-01), Sanie et al.
patent: 2005/0076316 (2005-04-01), Pierrat et al.
patent: 2005/0229130 (2005-10-01), Wu et al.
patent: 2006/0190854 (2006-08-01), Watt
patent: 2002-203907 (2002-07-01), None
patent: 2004-30382 (2004-01-01), None

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