4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Kyoji Yamashita

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Capacitance measurement circuit

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Defect inspection apparatus

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Defect inspection method and defect inspection apparatus

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Method and apparatus for aligning two objects, and method and ap

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Method and apparatus for aligning two objects, and method and ap

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Profile ID: LFUS-PAI-P-541524

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